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IONTOFジャパン株式会社
Support
Products
M6
M6 Plus
M6 Hybrid SIMS
Qtac
SurfaceLab 7
TOF-SIMS & LEIS Technique
Applications
Semiconductor
Polymer
Paints and Coatings
Biomaterials
Pharmaceuticals
Glass
Paper
Metals
Catalysts
Disclaimer
IONTOFジャパン株式会社
Support
Products
SIMS Instrumentation
(Note: This information is provided on our international webpage)
M6
The latest, multi-purpose instrument guaranteeing superior performance in all application areas.
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M6 Product
M6 Plus
The M6 Plus platform combines high-end SIMS performance with in situ SPM capabilities.
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M6 Plus Product
M6 Hybrid SIMS
High performance TOF-SIMS and Orbitrap SIMS combination instrument ideally suited for organic SIMS application.
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M6 Hybrid SIMS Product
Low Energy Ion Scattering
Qtac
Extremely surface sensitive instrument, providing unique and quantitative characterization of the top atomic layer.
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Qtac Product
Software
SurfaceLab 7
Versatile instrument operation, data acquisition and data analysis software package for all IONTOF instruments.
External link
SurfaceLab 7 software
How it works
TOF-SIMS and LEIS
Learn more about how advanced surface analysis works.
External link
TOF-SIMS / LEIS technique
Applications
Applications
(Note: This information is provided on our international webpage)
Semiconductor
The detection and quantification of trace metals is an important analytical task in the semiconductor industry.
External link
Semiconductor applications
Polymer
Discolourations on polymers are often caused by phase separation of the material's components.
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Polymer applications
Paints and Coatings
Coatings are of increasing importance for many industrial products for reasons of decoration as well as stability.
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Paints and Coatings applications
Biomaterials
The ability to image molecular compounds with high special resolution is very useful for biological applications.
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Biomaterials applications
Pharmaceuticals
SIMS can be used to determine the distribution of the different ingredients within pharmaceutical products.
External link
Pharmaceuticals applications
Glass
TOF-SIMS is a very powerful technique for the analysis of non-conductive materials e.g. glass.
External link
Glass applications
Paper
Paper surfaces are treated to obtain special surface properties. These modifications can be investigated.
External link
Paper applications
Metals
One major advantage of TOF-SIMS is the opportunity to combine high lateral and high depth resolution.
External link
Metals applications
Catalysts
For catalysis the characterization of the top atomic layer is essential. LEIS is the ideal technique for this application.
External link
Catalysts applications
IONTOFジャパン株式会社
ジャーマンインダストリーパーク 〒226-0006 神奈川県横浜市 緑区白山1丁目18-2
日本市場での包括的なローカルサポート
IONTOFジャパン株式会社は、日本を拠点にした IONTOF GmbH の子会社です。IONTOF は、飛行型二次イオン質量分析計(TOF-SIMS)および高感度な低エネルギーイオン散乱(LEIS)を取り扱うドイツの表面分析メーカーです。
IONTOFジャパン株式会社は過去20年間にわたり日本国内で IONTOF 製品のサービスを提供してきた (株)日立ハイテクサイエンスの販売・サービス活動を継承するために、2021年に設立されました。長年にわたって IONTOF 製品を扱ってきたエンジニアが継続してお客様のサポートを行います。
ジャーマンインダストリーパーク(横浜)には消耗品、サービスパーツなどを可能な限り短時間でご提供するため、サービス部品保管スペースを備えています。
また、装置をご検討いただきやすいようにデモルームには最新型 TOF-SIMS M6 を常設しております。デモンストレーションを通して性能や操作性を実感いただけます。